Get access
Advanced Materials

Mapping of Trap Densities and Hotspots in Pentacene Thin-Film Transistors by Frequency-Resolved Scanning Photoresponse Microscopy

Authors


Abstract

Frequency-resolved scanning photoresponse microscopy of pentacene thin-film transistors is reported. The photoresponse pattern maps the in-plane distribution of trap states which is superimposed by the level of trap filling adjusted by the gate voltage of the transistor. Local hotspots in the photoresponse map thus indicate areas of high trap densities within the pentacene thin film.

image
Get access to the full text of this article

Ancillary