Bert Nickel and co-workers report on page 2147 an in-situ characterization of the evolution of a pentacene-fullerene ambipolar transistor. The experiment highlights the importance of film percolation for interface charging in organic heterojunctions. The cover picture visualizes the pentacene/C60 transistor geometry during fullerene deposition, including topological and structural information obtained via AFM and X-ray investigations. Image: Christoph Hohmann, Nanosystems Initiative Munich.
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