Advanced Materials

Unexpected Dominance of Vertical Dislocations in High-Misfit Ge/Si(001) Films and Their Elimination by Deep Substrate Patterning (Adv. Mater. 32/2013)

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Abstract

An innovative strategy in dislocation analysis is described by Anna Marzegalli et al. on page 4408 demonstrating that vertical dislocations dominate in thick Ge layers on silicon substrates.

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