Scanning Photoemission Microscopy of Graphene Sheets on SiO2 (pages 3589–3591)
Ki-jeong Kim, Hangil Lee, Jae-Hyun Choi, Young-Sang Youn, Junghun Choi, Hankoo Lee, Tai-Hee Kang, M. C. Jung, H. J. Shin, Hu-Jong Lee, Sehun Kim and Bongsoo Kim
Version of Record online: 21 AUG 2008 | DOI: 10.1002/adma.200800742
Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C 1s core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphens through the chemical contrast images of SPEM.