Communication
The Nanoscale Morphology of a PCDTBT:PCBM Photovoltaic Blend
Article first published online: 28 APR 2011
DOI: 10.1002/aenm.201100144
Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Staniec, P. A., Parnell, A. J., Dunbar, A. D. F., Yi, H., Pearson, A. J., Wang, T., Hopkinson, P. E., Kinane, C., Dalgliesh, R. M., Donald, A. M., Ryan, A. J., Iraqi, A., Jones, R. A. L. and Lidzey, D. G. (2011), The Nanoscale Morphology of a PCDTBT:PCBM Photovoltaic Blend. Adv. Energy Mater., 1: 499–504. doi: 10.1002/aenm.201100144
Publication History
- Issue published online: 15 JUL 2011
- Article first published online: 28 APR 2011
- Manuscript Revised: 6 APR 2011
- Manuscript Received: 16 MAR 2011
Keywords:
- bulk heterojunction;
- GIWAXS;
- PCBM;
- PCDTBT;
- neutron reflectivity;
- photovoltaics

Neutron reflectivity and X-ray scattering have been used to characterise the structure of photovoltaic optimised PCDTBT:PCBM (1:4) blend films. A negative gradient of the PCBM forms spontaneously upon film casting – a fortuitous structure that is well matched for efficient charge extraction. Mild thermal annealing at 70 °C does not significantly modify the film structure, and any improvement in device efficiency is likely to be through the removal of trapped casting solvent.

1614-6840/asset/olbannercenter.jpg?v=1&s=2128da7ddb46dded65a60658dccfdd46bbe247f3)
