Quantifying Loss Mechanisms in Polymer:Fullerene Photovoltaic Devices

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Abstract

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Drift-diffusion modeling is used to quantify different loss mechanisms in polymer:fullerene photovoltaic devices. Based on the modeling, which takes into account the carrier-density dependence of the mobility, the relative importance of geminate recombination, bimolecular recombination, and the space-charge effect are able to be quantified under different conditions.

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