Thin Films: Mapping Spatially Resolved Charge Collection Probability within P3HT:PCBM Bulk Heterojunction Photovoltaics (Adv. Energy Mater. 2/2014)

Authors

  • D. M. Nanditha M. Dissanayake,

    Corresponding author
    1. Sustainable Energy Technologies Department, Brookhaven National Laboratory, Upton, NY, USA
    • Sustainable Energy Technologies Department, Brookhaven National Laboratory, Upton NY 11973 USA

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  • Ahsan Ashraf,

    1. Sustainable Energy Technologies Department, Brookhaven National Laboratory, Upton, NY, USA
    2. Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY, USA
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  • Yutong Pang,

    1. Sustainable Energy Technologies Department, Brookhaven National Laboratory, Upton, NY, USA
    2. Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY, USA
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  • Matthew D. Eisaman

    1. Sustainable Energy Technologies Department, Brookhaven National Laboratory, Upton, NY, USA
    2. Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY, USA
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Abstract

image

In article 1300525, D. M. Nanditha M. Dissanayake and co-workers show that unlike the behavior observed thicknesses typically used for devices (100 nm), electron-limited behavior is seen for a thicker active layer (920 nm) due to phase segregation in poly(3-hexythiophene-2,5-diyl):phenyl-C61-butyric acid methyl ester (P3HT:PCBM). The illustration shows prism-coupled guidedmodes used for spatially selective excitation in a P3HT:PCBM photovoltaic, which are used to obtain high-resolution profiles of charge-collection probability in the photoactive layer.

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