The Nanoscale Morphology of a PCDTBT:PCBM Photovoltaic Blend (pages 499–504)
Paul A. Staniec, Andrew J. Parnell, Alan D. F. Dunbar, Hunan Yi, Andrew J. Pearson, Tao Wang, Paul E. Hopkinson, Christy Kinane, Robert M. Dalgliesh, Athene M. Donald, Anthony J. Ryan, Ahmed Iraqi, Richard A. L. Jones and David G. Lidzey
Article first published online: 28 APR 2011 | DOI: 10.1002/aenm.201100144
Neutron reflectivity and X-ray scattering have been used to characterise the structure of photovoltaic optimised PCDTBT:PCBM (1:4) blend films. A negative gradient of the PCBM forms spontaneously upon film casting – a fortuitous structure that is well matched for efficient charge extraction. Mild thermal annealing at 70 °C does not significantly modify the film structure, and any improvement in device efficiency is likely to be through the removal of trapped casting solvent.