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Copyright © 2013 American Institute of Chemical Engineers
Volume 22, Issue 3
Pages fmi–fmi, i–i, 417–623
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220301
Robert C. Reid
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220302
D. J. Jeffrey and Andreas Acrivos
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220303
Joseph D. Henry Jr., Alain P. Lui and C. H. Kuo
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220304
C. B. Weinberger, G. F. Cruz-saenz and G. J. Donnelly
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220305
Naugab Lee and A. E. Dukler
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220306
G. S. Laddha, T. R. Krishnan, S. Viswanathan, S. Vedaiyan, T. E. Degaleesan and H. E. Hoelscher
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220307
C. H. Chen, J. G. Vermeychuk, J. A. Howell and Paul Ehrlich
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220308
Wai-biu Cheng and Richard S. H. Mah
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220309
Roland H. Heck, James Wei and James R. Katzer
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220310
Robert M. Wellek and Türker Gürkan
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220311
Miloslav Hartman and Robert W. Coughlin
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220312
Chi Tien, J. S. C. Hsieh and R. M. Turian
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220313
N. Nishida, Y. A. Liu, Leon Lapidus and S. Hiratsuka
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220314
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220315
Rajamani Rajagopalan and Chi Tien
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220316
Victor C. Van Der Mast and Leroy A. Bromley
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220317
N. Nishida, Y. A. Liu and A. Ichikawa
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220318
Gary L. Allen and Arthur W. Westerberg
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220319
Hiroaki Masuda, Takahiro Komatsu and Koichi Iinoya
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220320
Steven R. Auvil and Bruce W. Wilkinson
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220321
Daniel L. Cummings, David A. Himmelblau, John A. Oberteuffer and Gary J. Powers
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220322
J. J. Stanulonis, B. C. Gates and J. H. Olson
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220323
Ulrich Block and Bernd Hegner
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220324
Robert Siegel
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220325
D. W. Allen, E. R. Gerhard and M. R. Likins Jr.
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220326
Michael L. Michelsen
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220327
B. D. Kulkarni and L. K. Doraiswamy
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220328
Manoj Choudhary, Mark Propster and Julian Szekely
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220329
S. Y. Ayyash and W. D. McComb
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220330
Hugh M. Hulburt
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220331
Larry K. Brumfield and T. G. Theofanous
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220332
Dermot J. Collins and Charles W. Gorton
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220333
V. G. Rao and Y. B. G. Varma
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220334
Nicholas D. Sylvester and James P. Brill
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220335
Padmakar Mishra and Indramani Mishra
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220336
Kraemer D. Luks
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220337
R. L. Merriam
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220338
Chi Tien
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220339
Warren L. McCabe
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220340
N. P. Suh
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220341
George T. Tsao
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220342
Y. D. Kwon, J. P. A. Wallis, John Beek, R. M. Horne, R. M. Nedderman and G. Grossman
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220343
Article first published online: 17 JUN 2004 | DOI: 10.1002/aic.690220344