Cathodoluminescence wavelength imaging for spatial mapping of excitons bound to dislocations and structural defects in cds

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Abstract

By means of the unique technique of cathodoluminescence wavelength imaging we analyse the distribution and nature of dislocations in strain-distorted CdS by scanning the spatial pattern of a set of lines due to excitons bound to dislocation-related defects. The method is demonstrated to be most powerful for the study of dislocations in II–VI and other materials which play a crucial role in hetero-epistructures.

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