Cathodoluminescence wavelength imaging for spatial mapping of excitons bound to dislocations and structural defects in cds



By means of the unique technique of cathodoluminescence wavelength imaging we analyse the distribution and nature of dislocations in strain-distorted CdS by scanning the spatial pattern of a set of lines due to excitons bound to dislocation-related defects. The method is demonstrated to be most powerful for the study of dislocations in II–VI and other materials which play a crucial role in hetero-epistructures.