Measurement of CdxHgi-xTe composition depth profiles using auger electron spectrometry on bevelled sections
Version of Record online: 14 SEP 2004
Copyright © 1995 John Wiley & Sons Ltd.
Advanced Materials for Optics and Electronics
Volume 5, Issue 2, pages 79–86, March/April 1995
How to Cite
Gale, I. G., Clegg, J. B., Capper, P., Maxey, C. D., Mackett, P. and O'Keefe, E. (1995), Measurement of CdxHgi-xTe composition depth profiles using auger electron spectrometry on bevelled sections. Adv. Mater. Opt. Electron., 5: 79–86. doi: 10.1002/amo.860050204
- Issue online: 14 SEP 2004
- Version of Record online: 14 SEP 2004
- Manuscript Accepted: 24 NOV 1994
- Manuscript Received: 25 SEP 1993
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