Photoreflectance characterisation of GaAs and GaAs/GaAIAs structures grown by MOCVD
Article first published online: 14 SEP 2004
Copyright © 1995 John Wiley & Sons Ltd.
Advanced Materials for Optics and Electronics
Volume 5, Issue 6, pages 321–327, November/December 1995
How to Cite
Misiewicz, J., Jezierski, K., Sitarek, P., Markiewicz, P., Korbutowicz, R., Panek, M., Ściana, B. and Tłaczała, M. (1995), Photoreflectance characterisation of GaAs and GaAs/GaAIAs structures grown by MOCVD. Adv. Mater. Opt. Electron., 5: 321–327. doi: 10.1002/amo.860050605
- Issue published online: 14 SEP 2004
- Article first published online: 14 SEP 2004
- Manuscript Accepted: 5 OCT 1995
- Manuscript Received: 10 APR 1995
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