Advanced Materials for Optics and Electronics

Cover image for Advanced Materials for Optics and Electronics

March/April 1995

Volume 5, Issue 2

Pages fmi–fmi, 53–135

Currently known as: Advanced Functional Materials

  1. Masthead

    1. Top of page
    2. Masthead
    3. Articles
    4. Book Review
    1. Masthead (page fmi)

      Version of Record online: 14 SEP 2004 | DOI: 10.1002/amo.860050201

  2. Articles

    1. Top of page
    2. Masthead
    3. Articles
    4. Book Review
    1. Surface analytical techniques (pages 53–70)

      R. K. Wild

      Version of Record online: 14 SEP 2004 | DOI: 10.1002/amo.860050202

    2. Impurity survey analysis of CdxHgi−xTe by laser scan mass spectrometry (pages 71–78)

      F. Grainger, I. G. Gale, P. Capper, C. D. Maxey, P. Mackett, E. O'Keefe and J. Gosney

      Version of Record online: 14 SEP 2004 | DOI: 10.1002/amo.860050203

    3. Measurement of CdxHgi-xTe composition depth profiles using auger electron spectrometry on bevelled sections (pages 79–86)

      I. G. Gale, J. B. Clegg, P. Capper, C. D. Maxey, P. Mackett and E. O'Keefe

      Version of Record online: 14 SEP 2004 | DOI: 10.1002/amo.860050204

    4. Impurity study of CdZnTe substrates used for LPE HgCdTe (pages 87–99)

      A. B. Bollong, G. Feldewerth, J. P. Tower, S. P. Tobin, M. Kestigian, P. W. Norton, H. F. Schaake and C. K. Ard

      Version of Record online: 14 SEP 2004 | DOI: 10.1002/amo.860050205

    5. Macro- and microsegregation of Zn in bridgman-grown CdZnTe (pages 101–108)

      P. Capper, J. E. Harris, E. S. O'Keefe, C. L. Jones and I. Gale

      Version of Record online: 14 SEP 2004 | DOI: 10.1002/amo.860050206

  3. Book Review

    1. Top of page
    2. Masthead
    3. Articles
    4. Book Review

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