Growth and characterization of La0.8Sr0.2MnO3/Pb(Zr0.2Ti0.8)O3/La0.8Sr0.2MnO3 heterostructures for three-dimensional circuit studies



The structural and electronic properties of epitaxial colossal magnetoresistive oxide (CMR) / ferroelectric / CMR trilayers have been examined to investigate the feasibility of building all-oxide three-dimensional (3D) circuits. Epitaxial Pb(Zr0.2Ti0.8)O3 (PZT) films sandwiched by ultrathin La0.8Sr0.2MnO3 (LSMO) layers have been fabricated using off-axis magnetron sputtering, with high crystalline quality and smooth surfaces having been obtained. Both the top and bottom layers of LSMO exhibit CMR behavior.