SrBi2Nb2O9 thin films epitaxially grown on Pt epitaxial bottom layers: structural characteristics and nanoscale characterization of the ferroelectric behaviour by AFM
Version of Record online: 10 FEB 2004
Copyright © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Annalen der Physik
Volume 13, Issue 1-2, pages 35–38, January 2004
How to Cite
Duclère, J.-R., Guilloux-Viry, M., Bouquet, V., Perrin, A. and Gautier, B. (2004), SrBi2Nb2O9 thin films epitaxially grown on Pt epitaxial bottom layers: structural characteristics and nanoscale characterization of the ferroelectric behaviour by AFM. Ann. Phys., 13: 35–38. doi: 10.1002/andp.200310039
- Issue online: 10 FEB 2004
- Version of Record online: 10 FEB 2004
- Manuscript Accepted: 11 OCT 2003
- Manuscript Received: 11 SEP 2003
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