Domain wall creep in mixed c-a axis Pb(Zr0.2Ti0.8)O3 thin films

Authors


Abstract

Creep motion of ferroelectric domain walls in epitaxial Pb(Zr0.2Ti0.8)O3 thin films was studied by atomic force microscopy. The dynamical exponent μ was found to be smaller than in previous reports, with values significantly lower than 1 observed in samples with a-axis inclusions.

Ancillary