Rapid Research Letter
Probing the thermal response of a silicon field emitter by ultra-fast Laser Assisted Atom Probe Tomography
Article first published online: 20 DEC 2012
© 2012 by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Annalen der Physik
Special Issue: Ultrafast Phenomena on the Nanoscale
Volume 525, Issue 1-2, pages L1–L5, February 2013
How to Cite
Vella, A., Silaeva, E. P., Houard, J., Itina, T. E. and Deconihout, B. (2013), Probing the thermal response of a silicon field emitter by ultra-fast Laser Assisted Atom Probe Tomography. Ann. Phys., 525: L1–L5. doi: 10.1002/andp.201200182
- Issue published online: 8 FEB 2013
- Article first published online: 20 DEC 2012
- Accepted manuscript online: 25 DEC 2012 12:00AM EST
- Manuscript Accepted: 21 SEP 2012
- Manuscript Revised: 18 SEP 2012
- Manuscript Received: 13 JUL 2012
Options for accessing this content:
- If you have access to this content through a society membership, please first log in to your society website.
- If you would like institutional access to this content, please recommend the title to your librarian.
- Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
- You can purchase online access to this Article for a 24-hour period (price varies by title)
- If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
- New Users: Please register, then proceed to purchase the article.
Login via OpenAthens
Search for your institution's name below to login via Shibboleth.
Registered Users please login:
- Access your saved publications, articles and searches
- Manage your email alerts, orders and subscriptions
- Change your contact information, including your password
Please register to:
- Save publications, articles and searches
- Get email alerts
- Get all the benefits mentioned below!