XUV-induced transient phase gratings for probing ultra-fast carrier generation and recombination processes in wide-bandgap semiconductors
Version of Record online: 10 DEC 2012
© 2012 by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Annalen der Physik
Special Issue: Ultrafast Phenomena on the Nanoscale
Volume 525, Issue 1-2, pages 59–65, February 2013
How to Cite
Gabrysch, M., Schwenke, J., Balciunas, T., He, X., Rakowski, R., Johnsson, P., Canton, S. E., Isberg, J. and L'Huillier, A. (2013), XUV-induced transient phase gratings for probing ultra-fast carrier generation and recombination processes in wide-bandgap semiconductors. Ann. Phys., 525: 59–65. doi: 10.1002/andp.201200187
- Issue online: 8 FEB 2013
- Version of Record online: 10 DEC 2012
- Accepted manuscript online: 1 DEC 2012 12:00AM EST
- Manuscript Accepted: 2 NOV 2012
- Manuscript Revised: 4 OCT 2012
- Manuscript Received: 15 JUL 2012
- European Research Council
- Marie Curie Early Stage Training Site
- Marie Curie Initial Training Network ATTOFEL
- joint research activity ALADIN of Laserlab-Europe
- Knut and Alice Wallenberg Foundation
- Swedish Research Council
- Swedish Foundation for Strategic Research
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