SiO2/Ta2O5 Core–Shell Nanowires and Nanotubes

Authors

  • Yu-Lun Chueh,

    1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, ROC, Fax: (+886) 3-572-2366
    2. School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA
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  • Li-Jen Chou Prof.,

    1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, ROC, Fax: (+886) 3-572-2366
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  • Zhong Lin Wang Prof.

    1. School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0245, USA
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  • This research was supported by the National Science Council (grant no. NSC 94-2215-E-007-019), the Ministry of Education (grant no. 93-E-FA04-1-4), the Thousand Horse Program (no. 095-2917-1-007-014), the NSF, the NASA Vehicle System Program, the Department of Defense Research and Engineering (DDR&E), and the Defense Advanced Research Project Agency (N66001-040-1-18903).

Abstract

original image

Tantal auf Siliciums Spuren: SiO2/Ta2O5-Kern-Schale-Nanostrukturen wurden durch die Reduktion von SiO2-Nanodrähten in einer Ta-Atmosphäre bei 950 °C erhalten. Der Durchmesser der SiO2-Nanodrähte in den Nanostrukturen ist über die Reduktionsdauer steuerbar. In verdünnten HF-Lösungen verblieben von den Kern-Schale-Strukturen nur Ta2O5-Nanoröhren (siehe TEM-Bild), wohingegen längere Reduktionsdauern direkt zu Ta2O5-Nanodrähten führten.

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