We acknowledge the NSF (CTS-0404376), Advanced Micro Devices Inc., Engelhard Corporation, and UC-Discovery Grant for their financial support. We thank Dr. S. I. Zones of ChevronTexaco for his help on B-CHA single-crystal synthesis. k=Dielectric constant.
Communication
Mechanical and Dielectric Properties of Pure-Silica-Zeolite Low-k Materials†
Article first published online: 23 AUG 2006
DOI: 10.1002/anie.200602036
Copyright © 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Issue

Angewandte Chemie International Edition
Volume 45, Issue 38, pages 6329–6332, September 25, 2006
Additional Information
How to Cite
Li, Z., Johnson, M. C., Sun, M., Ryan, E. T., Earl, D. J., Maichen, W., Martin, J. I., Li, S., Lew, C. M., Wang, J., Deem, M. W., Davis, M. E. and Yan, Y. (2006), Mechanical and Dielectric Properties of Pure-Silica-Zeolite Low-k Materials. Angew. Chem. Int. Ed., 45: 6329–6332. doi: 10.1002/anie.200602036
- †
Publication History
- Issue published online: 19 SEP 2006
- Article first published online: 23 AUG 2006
- Manuscript Received: 23 MAY 2006
Funded by
- NSF. Grant Number: CTS-0404376
- Advanced Micro Devices Inc.
- Engelhard Corporation
- UC-Discovery Grant
Keywords:
- mechanical properties;
- porous materials;
- silicates;
- thin films;
- zeolites

Specialk: Pure silica zeolites (PSZs) have been shown experimentally to display a remarkably higher elastic modulus than amorphous porous silicas at any given porosity or dielectric constant (k) value as a result of their crystalline structure. The combined experimental and theoretical findings suggest that PSZs have the necessary properties for use as the next generation of low-k insulators.

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