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Aberration-Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles

Authors


  • L.C.G. acknowledges P. Ash and D. Thompsett from the Johnson Matthey Technology Centre, Reading (UK), for valuable discussions, provision of samples, and financial support. The authors are grateful to the EPSRC and the Royal Society for financial support.

Abstract

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Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration).

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