C.N., A.M.F., and P.M. were supported by the Australian Research Council (DP Grant 0558608 and FF0561486). I.P.-S. and L.M.L.-M. were supported by the Spanish Ministerio de Educación y Ciencia (Grants MAT2004-02991 and NAN2004-09133). C.N. acknowledges the University of Melbourne for the MIRS and MIFRS scholarships. I.P.-S. acknowledges the Xunta de Galicia for an Isidro Parga Pondal fellowship.
Spectroscopy and High-Resolution Microscopy of Single Nanocrystals by a Focused Ion Beam Registration Method†
Article first published online: 30 MAR 2007
Copyright © 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Angewandte Chemie International Edition
Volume 46, Issue 19, pages 3517–3520, May 4, 2007
How to Cite
Novo, C., Funston, Alison M., Pastoriza-Santos, I., Liz-Marzán, Luis M. and Mulvaney, P. (2007), Spectroscopy and High-Resolution Microscopy of Single Nanocrystals by a Focused Ion Beam Registration Method. Angew. Chem. Int. Ed., 46: 3517–3520. doi: 10.1002/anie.200700033
- Issue published online: 27 APR 2007
- Article first published online: 30 MAR 2007
- Manuscript Revised: 19 FEB 2007
- Manuscript Received: 3 JAN 2007
- Australian Research Council. Grant Numbers: 0558608, FF0561486
- Spanish Ministerio de Educación y Ciencia. Grant Numbers: MAT2004-02991, NAN2004-09133
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