The Singapore National Research Foundation (NRF Award No. NRF-RF2010-03 to C.A.N.) is kindly acknowledged for supporting this research.
Dependency of the Tunneling Decay Coefficient in Molecular Tunneling Junctions on the Topography of the Bottom Electrodes†
Version of Record online: 25 FEB 2014
© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Angewandte Chemie International Edition
Volume 53, Issue 13, pages 3377–3381, March 24, 2014
How to Cite
Yuan, L., Jiang, L., Zhang, B. and Nijhuis, C. A. (2014), Dependency of the Tunneling Decay Coefficient in Molecular Tunneling Junctions on the Topography of the Bottom Electrodes. Angew. Chem. Int. Ed., 53: 3377–3381. doi: 10.1002/anie.201309506
- Issue online: 19 MAR 2014
- Version of Record online: 25 FEB 2014
- Manuscript Received: 1 NOV 2013
- Singapore National Research Foundation. Grant Number: NRF-RF2010-03
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