The structure of oriented transfer films of poly(tetrafluoroethylene) (PTFE), previously used as orientation-inducing layers for a variety of materials, was studied. Transmission electron microscopy and X-ray diffractometry were empolyed to determine the continuity and relative volume of the PTFE films, which were deposited onto glass substrates by friction transfer at controlled temperatures, pressures, and sliding rates. The thickness and continuity of the films were found to increase with increasing temperature and applied pressure. In the range of sliding rates used (0.1–10 mm/s), no significant correlation between this processing variable and the thickness or continuity was apparent. Transmission electron microscope investigations showed that, generally, the (100) plane of the PTFE crystalline unit cell was parallel to the glass surface. © 1993 John Wiley & Sons, Inc.