Current address: Process Development, Cytos Biotechnology AG, Zurich-Schlieren, Switzerland
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Nondestructive near-infrared spectroscopic measurement of multiple analytes in undiluted samples of serum-based cell culture media
Article first published online: 4 DEC 2001
DOI: 10.1002/bit.10093
Copyright © 2002 John Wiley & Sons, Inc.
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How to Cite
Rhiel, M., Cohen, M. B., Murhammer, D. W. and Arnold, M. A. (2002), Nondestructive near-infrared spectroscopic measurement of multiple analytes in undiluted samples of serum-based cell culture media. Biotechnol. Bioeng., 77: 73–82. doi: 10.1002/bit.10093
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Current address: Process Development, Cytos Biotechnology AG, Zurich-Schlieren, Switzerland
Publication History
- Issue published online: 4 DEC 2001
- Article first published online: 4 DEC 2001
- Manuscript Accepted: 9 AUG 2001
- Manuscript Received: 14 JAN 2001
Funded by
- National Aeronautics and Space Administration. Grant Number: NAG 9-824
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