AT&T Technical Journal

Cover image for AT&T Technical Journal

March 1985

Volume 64, Issue 3

Pages 661–882

Currently known as: Bell Labs Technical Journal

  1. Introduction

    1. Top of page
    2. Introduction
    3. Original Article
    1. Introduction (pages 661–669)

      R. L. Easton, R. L. Hartman and F. R. Nash

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1985.tb00444.x

  2. Original Article

    1. Top of page
    2. Introduction
    3. Original Article
    1. Selection of a Laser Reliability Assurance Strategy for a Long-Life Application (pages 671–715)

      F. R. Nash, W. B. Joyce, R. L. Hartman, E. I. Gordon and R. W. Dixon

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1985.tb00445.x

    2. Methodology of Accelerated Aging (pages 717–764)

      W. B. Joyce, K-Y. Liou, F. R. Nash, P. R. Bossard and R. L. Hartman

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1985.tb00446.x

    3. A Statistical Approach to Laser Certification (pages 765–770)

      A. R. Eckler

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1985.tb00447.x

    4. 1.3-μm Laser Reliability Determination for Submarine Cable Systems (pages 771–807)

      B. W. Hakki, P. E. Fraley and T. F. Eltringham

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1985.tb00448.x

    5. Implementation of the Proposed Reliability Assurance Strategy for an InGaAsP/InP, Planar Mesa, Buried Heterostructure Laser Operating at 1.3 μm for Use in a Submarine Cable (pages 809–860)

      F. R. Nash, W. J. Sundburg, R. L. Hartman, J. R. Pawlik, D. A. Ackerman, N. K. Dutta and R. W. Dixon

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1985.tb00449.x

    6. Reliability of InGaAs Photodiodes for SL Applications (pages 861–882)

      R. H. Saul, F. S. Chen and P. W. Shumate Jr.

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1985.tb00450.x

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