AT&T Technical Journal

Cover image for AT&T Technical Journal

May-June 1990

Volume 69, Issue 3

Pages 2–120

Currently known as: Bell Labs Technical Journal

  1. Original Article

    1. Top of page
    2. Original Article
    1. Design for X (DFX): Key to Competitive, Profitable Products (pages 2–13)

      David A. Gatenby and George Foo

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00332.x

    2. Mechanical Equipment Design for Simplicity (pages 14–27)

      Ronald G. Watson, Ellen M. Theis and Robert S. Janek

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00333.x

    3. Design for Multinational EMC Compliance (pages 28–45)

      Donald N. Heirman, Robert C. Morris and Steven M. Crosby

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00334.x

    4. Computer-Aided Design for Quality (CADQ) (pages 46–60)

      Lihsin Liu, William A. Nazaret and Richard G. Beale

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00335.x

    5. Design for Material Logistics (pages 61–76)

      George Foo, James P. Clancy, Lawrence E. Kinney and Charles R. Lindemulder

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00336.x

    6. Design for Electrostatic-Discharge (ESD) Protection in Telecommunications Products (pages 77–96)

      Terry L. Welsher, Timothy J. Blondin, G. Theodore Dangelmayer and Yehuda Smooha

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00337.x

    7. Automated Bist for Regular Structures Embedded in Asic Devices (pages 97–109)

      Duane R. Aadsen, Harold N. Scholz and Yervant Zorian

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00338.x

    8. Software Productivity Measurements (pages 110–120)

      Weider D. Yu, D. Paul Smith and Steel T. Huang

      Version of Record online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1990.tb00339.x

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