AT&T Technical Journal

Cover image for AT&T Technical Journal

March-April 1994

Volume 73, Issue 2

Pages 2–85

Currently known as: Bell Labs Technical Journal

  1. AT&T Innovation Briefs

    1. Top of page
    2. AT&T Innovation Briefs
    3. Original Article
    1. AT&T Innovation Briefs (pages 2–3)

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00572.x

  2. Original Article

    1. Top of page
    2. AT&T Innovation Briefs
    3. Original Article
    1. Testing Goes Critical Path (pages 4–9)

      Richard L. Campbell and Richard A. Tarbox

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00573.x

    2. Trends in Digital Device Test Methodologies (pages 10–18)

      F. Edward Crane III, Scott Davidson, Jack Kane, Charles E. Stroud and Shianling Wu

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00574.x

    3. Automatic Test Generation for Digital Electronic Circuits (pages 19–29)

      Tapan J. Chakraborty, Scott Davidson, Fadi Maamari and Kwang-Ting Cheng

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00575.x

    4. Built-in Self-Test for Digital Integrated Circuits (pages 30–39)

      Vishwani D. Agrawal, Chih-Jen Lin, Paul W. Rutkowski, Shianling Wu and Yervant Zorian

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00576.x

    5. Boundary-Scan Testing for Electronic Subassemblies and Systems (pages 40–48)

      Chi W. Yau, James Beausang, F. Edward Crane III, Najml T. Jarwala and Rodham E. Tulloss

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00577.x

    6. Extending Design-for-Test Into the Analog and Mixed-Signal Domains (pages 49–55)

      Philip V. Lopresti

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00578.x

    7. Ensuring Structural Testability of High-Density SMT Circuit Packs (pages 56–65)

      Robert W. Allen Jr., Robert L. Calafiore, William W. Dyer III, Michael V. Febo and Timothy K. Sinclair

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00579.x

    8. Non-Destructive Optical Techniques for Characterizing Semiconductor Materials and Devices (pages 66–76)

      Gary E. Carver, Mary L. Gray, Jerome Levkoff, Blair W. Miller and Sunil B. Phatak

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00580.x

    9. Environmental Stress Testing (pages 77–85)

      H. Anthony Chan, Paul J. Englert, Michael A. Oien and S. (Raja) Rajaram

      Article first published online: 29 JUL 2013 | DOI: 10.1002/j.1538-7305.1994.tb00581.x

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