This paper is based on a thesis submitted by Zina Lee in partial fulfillment of the requirements for the degree of Master of Arts. Data collection was supported by Grant R-410-98-1246 from the Social Sciences and Humanities Research Council awarded to Raymond R. Corrado. Thanks to Irwin Cohen, Melanie Boudreau, and the staff at the custody centers for their assistance in data collection, to Jim Hemphill and Ray Koopman for their time and statistical advice, and to Paul Frick for his assistance.
The validity of the Antisocial Process Screening Device as a self-report measure of psychopathy in adolescent offenders†
Article first published online: 20 DEC 2003
Copyright © 2003 John Wiley & Sons, Ltd.
Behavioral Sciences & the Law
Special Issue: Juvenile Psychopathy
Volume 21, Issue 6, pages 771–786, November/December 2003
How to Cite
Lee, Z., Vincent, G. M., Hart, S. D. and Corrado, R. R. (2003), The validity of the Antisocial Process Screening Device as a self-report measure of psychopathy in adolescent offenders. Behav. Sci. Law, 21: 771–786. doi: 10.1002/bsl.561
- Issue published online: 20 DEC 2003
- Article first published online: 20 DEC 2003
- Manuscript Accepted: 22 AUG 2003
- Manuscript Revised: 20 AUG 2003
- Manuscript Received: 29 MAY 2003
There is a growing interest in the assessment of adolescent psychopathy to enable early treatment and intervention. Recently, a self-report measure has been developed to assess psychopathic traits in adolescents. The Antisocial Process Screening Device (APSD), a self-report measure of psychopathic traits, and the Psychopathy Checklist: Youth Version (PCL:YV), a clinical rating scale, were administered to a sample of 100 incarcerated male adolescent offenders to assess the concurrent validity of the APSD. Results indicated that the APSD had limited concurrent validity with respect to the PCL:YV and that there appears to be a method effect in the measurement of psychopathy. Thus, it appears the APSD did not assess psychopathy in a manner parallel to that of the PCL:YV. Copyright © 2003 John Wiley & Sons, Ltd.