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Copyright © 2012 American Institute of Chemical Engineers
Volume 9, Issue 3
Pages 221–344
James C. Liao and Javier Delgado
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a001
Fangxiao Yang and Alan J. Russell
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a002
Matthew A. Jones, Peter K. Kilpatrick and Ruben G. Carbonell
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a003
Ajit Sadana and A. Madugula
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a004
R. Alex Speers, Timothy D. Durance, Marvin A. Tung and Janet Tou
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a005
Douglas D. Frey, Eberhard Schweinheim and Csaba Horváth
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a006
James L. Manganaro and Bruce S. Goldberg
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a007
I. Camelin, C. Lacroix, C. Paquin, H. Prévost, R. Cachon and C. Divies
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a008
John G. Gaertner and Prasad Dhurjati
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a009
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a010
Scott A. Mckelvey, Jason A. Gehrig, Kathryn A. Hollar and Wayne R. Curtis
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a011
Masayuki Ishiye, Mitsuo Yamashita and Mineo Niwa
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a012
Gerhard B. Ryhiner, Elmar Heinzle and Irving J. Dunn
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a013
Article first published online: 5 SEP 2008 | DOI: 10.1021/bp00021a900