Atomic Resolution Analysis of Microporous Titanosilicate ETS-10 through Aberration Corrected STEM Imaging

Authors

  • Dr. Alvaro Mayoral,

    Corresponding author
    1. Laboratorio de Microscopias Avanzadas (LMA), Nanosicence Institute of Aragon (INA), Universidad de Zaragoza, Mariano Esquillor, Edificio I+D, 50018, Zaragoza (Spain)
    • Laboratorio de Microscopias Avanzadas (LMA), Nanosicence Institute of Aragon (INA), Universidad de Zaragoza, Mariano Esquillor, Edificio I+D, 50018, Zaragoza (Spain)
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  • Prof. Joaquin Coronas,

    1. Chemical and Environmental Engineering Department and Nanoscience Institute of Aragon (INA), Universidad of Zaragoza, Maria de Luna 3, 50018 Zaragoza (Spain)
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  • Dr. Clara Casado,

    1. Department of Chemical Engineering & Inorganic Chemistry, University of Cantabria, Av. Los Castros s/n, 39005 Santander (Spain)
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  • Dr. Carlos Tellez,

    1. Chemical and Environmental Engineering Department and Nanoscience Institute of Aragon (INA), Universidad of Zaragoza, Maria de Luna 3, 50018 Zaragoza (Spain)
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  • Dr. Isabel Díaz

    1. Instituto de Catálisis y Petroleoquímica, CSIC, Marie Curie, 2. 28049 Madrid (Spain)
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Abstract

original image

It′s all your fault! Microporous titanosilicate ETS-10 crystals have been analyzed by advanced electron microscopy techniques. With the last generation of spherical aberration corrected electron microscopes, truly atomic resolution images have been recorded. Owing to the extremely high-resolution images that have been obtained, the multiple defects (stacking faults, lack of porosity and “double-pores”) present in this type of material can be analyzed in great detail.

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