Yield Stress Measurement of Silicon Nitride Suspensions
Version of Record online: 19 MAY 2008
Copyright © 2002 Canadian Society for Chemical Engineering
The Canadian Journal of Chemical Engineering
Volume 80, Issue 6, pages 1175–1180, December 2002
How to Cite
Zhu, L., Papadopoulos, K. and De Kee, D. (2002), Yield Stress Measurement of Silicon Nitride Suspensions. Can. J. Chem. Eng., 80: 1175–1180. doi: 10.1002/cjce.5450800619
- Issue online: 19 MAY 2008
- Version of Record online: 19 MAY 2008
- Manuscript Accepted: 16 DEC 2002
- Manuscript Revised: 3 DEC 2002
- Manuscript Received: 5 APR 2002
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