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Outer Helmholtz Plane of the Electrical Double Layer Formed at the Solid Electrode–Liquid Interface

Authors

  • Dr. Masashi Nakamura,

    Corresponding author
    1. Department of Applied Chemistry and Biotechnology, Graduate school of engineering, Chiba University, Yayoi-cho 1-33, Inage-ku, Chiba 263-8522 (Japan), Fax: (+81) 43-290-3382
    • Department of Applied Chemistry and Biotechnology, Graduate school of engineering, Chiba University, Yayoi-cho 1-33, Inage-ku, Chiba 263-8522 (Japan), Fax: (+81) 43-290-3382
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  • Narumasa Sato,

    1. Department of Applied Chemistry and Biotechnology, Graduate school of engineering, Chiba University, Yayoi-cho 1-33, Inage-ku, Chiba 263-8522 (Japan), Fax: (+81) 43-290-3382
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  • Prof. Dr. Nagahiro Hoshi,

    1. Department of Applied Chemistry and Biotechnology, Graduate school of engineering, Chiba University, Yayoi-cho 1-33, Inage-ku, Chiba 263-8522 (Japan), Fax: (+81) 43-290-3382
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  • Dr. Osami Sakata

    1. Research and Utilization Division, Japan Synchrotron Radiation Research Institute/SPring-8, Kouto 1-1-1, Sayo, Sayo-gun, Hyogo 679-5198 (Japan), CREST, JST, Sanbancho Bldg., 5, Sanbancho, Chiyoda-ku, Tokyo 102-0075 (Japan)
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Abstract

original image

Electrical double layer: The detailed outer Helmholtz plane (HP) structure composed of Cs+ above c(2×2)-Br on Ag(100) electrode using in situ surface X-ray diffraction in electrochemical environments is described. Hydrated Cs+ cations are accommodated in the hollow sites of the c(2×2)-Br layer. The coverage of Cs+ and the distance of the Cs+ layer from the surface depend on the electrode potential. A single layer of water is intercalated between the inner and outer HP ions (see picture).

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