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Keywords:

  • catalysis;
  • electron microscopy;
  • nanoparticles;
  • oxides;
  • surface analysis
Thumbnail image of graphical abstract

Watching the changes: Aberration-corrected transmission electron microscopy is used to image CeO2 nanoparticles during an electron-beam-induced structure transformation. Analysis of the phase of the computationally restored exit wavefunction (see Figure, a) allows the nature of the different surfaces (b) to be characterized for the first time and provides direct experimental verification of previously reported theoretical surface structure calculations.