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Mapping of Surface-Enhanced Fluorescence on Metal Nanoparticles using Super-Resolution Photoactivation Localization Microscopy

Authors

  • Dr. Hongzhen Lin,

    1. Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
    2. Current address: i-LAB, Suzhou Institute of Nanotech and Nanobionics, Chinese Academy of Sciences (CAS), Suzhou 215125 (PR China)
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    • These authors contributed equally to this work.

  • Dr. Silvia P. Centeno,

    1. Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
    2. Departmento de Química Física, Universidad de Málaga, Campus Teatinos, S/N, 29071, Málaga (Spain)
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    • These authors contributed equally to this work.

  • Liang Su,

    1. Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
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  • Bart Kenens,

    1. Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
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  • Susana Rocha,

    1. Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
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  • Dr. Michel Sliwa,

    1. CNRS UMR 8516/Université Lille Nord de France, Universite Lille1 Sciences et Technologies, Chemistry Department bât C5 59655 Villeneuve d'Ascq Cedex (France)
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  • Prof. Dr. Johan Hofkens,

    1. Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
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  • Prof. Dr. Hiroshi Uji-i

    Corresponding author
    1. Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
    2. PRESTO (Japan) Science and Technology Agency (JST), 4-1-8 Honcho Kawaguchi, Saitama 332-0012 (Japan)
    • Katholieke Universiteit Leuven, Celestijnenlaan 200F 3001 Heverlee (Belgium), Fax: (+32) 6-327989
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Abstract

Photoactivation localization microscopy (PALM) was applied to study surface-enhanced fluorescence (SEF) on metal nanostructures (SEF-PALM). The detection of fluorescence from individual single molecules can be used to image the point-spread-function and spatial distribution of the fluorescence emitted in the vicinity of a metal surface. Due to the strong scattering effect, the angular distribution of the fluorescence is altered by metals, resulting in a spatial shift of fluorescence spots with respect to the metal nanostructures, and has to be taken into account in the analysis. SEF-PALM can be used to discriminate effects of labelling density when estimating the enhancement factor in SEF. Furthermore, nanostructures with sizes below the diffraction limit can be resolved using this technique. SEF-PALM is established as a powerful tool to study plasmon-mediated phenomena on metal nanostructures.

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