Fixed Pattern Noise in Localization Microscopy
Article first published online: 31 JAN 2014
© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Special Issue: Superresolution Imaging and Nanophotonics
Volume 15, Issue 4, pages 677–686, March 17, 2014
How to Cite
Fox-Roberts, P., Wen, T., Suhling, K. and Cox, S. (2014), Fixed Pattern Noise in Localization Microscopy. ChemPhysChem, 15: 677–686. doi: 10.1002/cphc.201300756
- Issue published online: 14 MAR 2014
- Article first published online: 31 JAN 2014
- Manuscript Revised: 23 OCT 2013
- Manuscript Received: 15 AUG 2013
- Royal Society. Grant Number: MR/K015664/1
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