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Correlative Atomic Force Microscopy and Localization-Based Super-Resolution Microscopy: Revealing Labelling and Image Reconstruction Artefacts

Authors

  • Aitor Monserrate,

    1. Madrid Institute for Advanced Studies in Nanoscience (IMDEA Nanociencia), C/Faraday 9, Madrid 28049 (Spain)
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  • Dr. Santiago Casado,

    Corresponding author
    1. Madrid Institute for Advanced Studies in Nanoscience (IMDEA Nanociencia), C/Faraday 9, Madrid 28049 (Spain)
    • Madrid Institute for Advanced Studies in Nanoscience (IMDEA Nanociencia), C/Faraday 9, Madrid 28049 (Spain)

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  • Dr. Cristina Flors

    Corresponding author
    1. Madrid Institute for Advanced Studies in Nanoscience (IMDEA Nanociencia), C/Faraday 9, Madrid 28049 (Spain)
    • Madrid Institute for Advanced Studies in Nanoscience (IMDEA Nanociencia), C/Faraday 9, Madrid 28049 (Spain)

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Abstract

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Hybrid microscopy: A correlative microscopy tool that combines in situ super-resolution fluorescence microscopy based on single-molecule localization and atomic force microscopy is presented. Direct comparison with high- resolution topography allows the authors to improve fluorescence labeling and image analysis in super-resolution imaging.

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