The Origin and Dynamics of Soft X-Ray-Excited Optical Luminescence of ZnO (pages 3625–3631)
Dr. Lidia Armelao, Dr. Franziskus Heigl, Dr. Sophie Brunet, Dr. Ramaswami Sammynaiken, Dr. Tom Regier, Dr. Robert I. R. Blyth, Dr. Lucia Zuin, Dr. Rami Sankari, Dr. Johannes Vogt and Prof. Tsun-Kong Sham
Version of Record online: 15 NOV 2010 | DOI: 10.1002/cphc.201000730
The interplay of size, crystallinity, morphology and excitation energy is correlated with the optical emissions in ZnO materials, providing direct evidence of the different behaviour and crucial role of bulk and surface defects in the origin of luminescence (see picture). Soft X-ray excited optical luminescence (XEOL), allowing site-specific chemical information and luminescence information concurrently, and time-resolved XEOL from a synchrotron light source was used to obtain the results.