Original Paper

Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples

  1. B. C. Mohanty,
  2. S. Kasiviswanathan

Article first published online: 16 DEC 2005

DOI: 10.1002/crat.200410530

Issue

Crystal Research and Technology

Crystal Research and Technology

Volume 41, Issue 1, pages 59–63, January 2006

Additional Information

How to Cite

Mohanty, B. C. and Kasiviswanathan, S. (2006), Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples. Cryst. Res. Technol., 41: 59–63. doi: 10.1002/crat.200410530

Author Information

  1. Department of Physics, Indian Institute of Technology Madras, Chennai 600 036, India

Publication History

  1. Issue published online: 16 DEC 2005
  2. Article first published online: 16 DEC 2005
  3. Manuscript Accepted: 9 DEC 2004
  4. Manuscript Received: 23 NOV 2004

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Keywords:

  • thin films;
  • Ag2Te;
  • TEM;
  • RBS

Abstract

Formation of Ag2Te thin films from room temperature (300 K) solid state reaction of Ag and Te thin film couples is investigated. Rutherford Backscattering Spectrometry (RBS) studies confirmed the complete miscibility of the couples and the stoichiometry of the resulting Ag2Te. Structural analysis by Transmission Electron Microscopy (TEM) showed a fine-grained structure with monoclinic and orthorhombic phases. Annealing at high temperatures resulted in the growth of giant crystallites with monoclinic phase at random sites. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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