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Keywords:

  • chalcogenides;
  • semiconductor;
  • crystal structure;
  • X-ray powder diffraction;
  • Rietveld refinement

Abstract

The crystal structure of the chalcogenide compounds CuFeAlSe3 and CuFeGaSe3, belonging to the system I-II-III-III3, were characterized using X-ray powder diffraction data. Both compounds crystallize in the tetragonal space group P42c (N° 112), Z = 1, with unit cell parameters a = 5.609(1) Å, c = 10.963(2) Å for CuFeAlSe3 and a = 5.6165(3) Å, c = 11.075(1) Å for CuFeGaSe3. These compounds are isostructural with CuFeInSe3, and have a normal adamantane structure. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)