Original Paper

The Dual Mode Microwave Afterglow Apparatus for Measuring the Electron Temperature Dependence of the Electron-Ion Recombination

  1. O. Mikuš1,
  2. P. Lukáč1,
  3. I. Morva2,*,
  4. M. Morvová2,
  5. V. Foltin3

Article first published online: 15 MAY 2008

DOI: 10.1002/ctpp.200810055

Issue

Contributions to Plasma Physics

Contributions to Plasma Physics

Volume 48, Issue 4, pages 311–325, May 2008

Additional Information

How to Cite

Mikuš, O., Lukáč, P., Morva, I., Morvová, M. and Foltin, V. (2008), The Dual Mode Microwave Afterglow Apparatus for Measuring the Electron Temperature Dependence of the Electron-Ion Recombination. Contrib. Plasma Phys., 48: 311–325. doi: 10.1002/ctpp.200810055

Author Information

  1. 1

    Plasma Physics Division

  2. 2

    Department of Astronomy, Earth Sciences, and Meteorology

  3. 3

    Experimental Physics Department, Faculty of Mathematics, Physics and Informatics, Comenius University Mlynská dolina F2, 842 48 Bratislava, Slovakia

*Phone: +00421 602 95 153, Fax: +00421 602 999 999

Publication History

  1. Issue published online: 15 MAY 2008
  2. Article first published online: 15 MAY 2008
  3. Manuscript Accepted: 26 FEB 2008
  4. Manuscript Received: 15 NOV 2007

Funded by

  • Slovak Grant Agency VEGA. Grant Numbers: 1/2014/05, 1/3043/06, 1/3068/06
  • Science and Technology Assistance Agency – APVV. Grant Number: 0267-06

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Keywords:

  • Stationary afterglow plasma;
  • microwave diagnostics of plasma;
  • electron heating with microwaves;
  • dissociative recombination;
  • electron temperature dependence of recombination;
  • molecular neon ions

Abstract

Three dual mode microwave apparatus (one using S -band and two using X -band) have been developed to determine ambipolar diffusion and electron-ion recombination rates under conditions such that Tgas = 300K and Te is varied from 300 K to 6300 K, in the afterglow period of the dc glow discharge. TheTM010 cylindrical cavity (in S -band) and TM011 open cylindrical cavity (X -band) are used to determine the electron density during the afterglow period and a non-resonant waveguide mode is used to apply a constant microwave heating field to the electrons. To test the properties of the apparatus the neon afterglow plasma has been investigated. At Te = 300 K a value of α (Ne+2) = (1.7± 0.2) × 10–7cm3/s is obtained which is in good agreement with values of other investigators. Also similar variations of α as T–0.4e (S -band) and as T–0.42e (X -band) obeyed over the range 300 ≤ Te ≤ 6300K are in good agreement with some other previous measurements. The simplicity of the X-band microwave apparatus also allows the measurements of the gas temperature dependency and the study of electron attachment and may be used simultaneously with optical or mass spectrometry investigations. (© 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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