The authors thank the MIUR for the financial support within the FISR thematic activities: Nanosystems of transition metal oxide for solid oxide fuel cells (SOFCs) (New systems for energy production and storage program).
In-Situ Growth and Characterization of Highly Textured La0.9Sr0.1MnO3 Films on LaAlO3(100) Substrates†
Article first published online: 29 JUN 2010
Copyright © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Chemical Vapor Deposition
Volume 16, Issue 4-6, pages 143–150, June 2010
How to Cite
Toro, R. G., Malandrino, G., Perdicaro, L. M.S., Fiorito, D. M.R., Andreone, A., Lamura, G. and Fragalà, I. L. (2010), In-Situ Growth and Characterization of Highly Textured La0.9Sr0.1MnO3 Films on LaAlO3(100) Substrates. Chem. Vap. Deposition, 16: 143–150. doi: 10.1002/cvde.200906778
- Issue published online: 29 JUN 2010
- Article first published online: 29 JUN 2010
- Manuscript Revised: 24 FEB 2010
- Manuscript Received: 13 JAN 2009
- Transport properties;
- Multicomponent source;
- Depth profile;
La0.9Sr0.1MnO3 (LSMO) films are grown on LaAlO3(100) substrates through metal-organic (MO)CVD using “second generation” precursors of Sr, La, and Mn. An in-situ novel MOCVD strategy is adopted which involves the use of two different molten mixtures consisting of the La(hfa)3•diglyme and Sr(hfa)2•tetraglyme adducts as La and Sr sources, respectively, and Mn(hfa)2•tmeda or Mn(tmhd)3 as Mn precursor [Hhfa = 1,1,1,5,5,5-hexafluoro-2,4-pentanedione, diglyme = bis(2-methoxyethyl)ether, tetraglyme = 2,5,8,11,14-pentaoxapentadecane, tmeda = N,N,N′,N′-tetramethylethylendiamine and H-tmhd = 2,2,6,6-tetramethyl-3,5-heptandione]. The X-ray diffraction (XRD) patterns show that the films are c-axis oriented. Pole figures are applied as a simple non-invasive tool to assess the textural nature of these LSMO films. The morphology is investigated using the scanning electron microscopy (SEM) and atomic force microscopy (AFM) that reveal the presence of grains, 300 nm average dimensions, and a root mean square (rms) surface roughness of 21 nm. Chemical composition through energy-dispersive X-ray (EDX) analysis indicates that the films possess a stoichiometry of about 0.9:0.1:1 ratio, while X-ray photoelectron spectroscopy (XPS) depth profiles are used to assess the vertical compositional homogeneity. The ferromagnetic/paramagnetic and metallic/insulating transition temperatures are determined by standard four-contact resistivity versus temperature measurements.