Determination of Temperature Gradients with Micrometric Resolution by Local Open Circuit Potential Measurements at a Scanning Microelectrode

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Abstract

A method to determine localized temperature profiles using a scanning electrochemical microscopy (SECM) setup and potentiometry is presented. A Pt microelectrode was first calibrated to correlate the open circuit potential (OCP) with temperature in an electrolyte containing ferri/ferrocyanide. Using the calibration graph, the temperature at a given position and a time could be derived. For dynamic measurements, the thermal expansion of the surface was initially determined using shear force mode SECM. Following the OCP at the microelectrode static as well as dynamic temperature gradients above the heated surface were successfully probed and visualized with vertical micrometric resolution and with precision in temperature determination below 1 °C.

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