Short contribution: A new method of analyzing and documenting micromorphological thin sections using flatbed scanners: Applications in geoarchaeological studies

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Abstract

Much of the information in micromorphological thin sections exists at the mesoscopic level. The use of flatbed scanners can improve analysis at this level and aid in preservation of the information. This article describes scanning in both plane and cross-polarized light and discusses the hardware and software required. © 2002 Wiley Periodicals, Inc.

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