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2013GL056970Rsuptext01.docxWord 2007 document20Ktext01: Descriptions of image processing and lattice-Boltzmann simulations.
2013GL056970Rfs01.tifTIFF image547K(a) An image of FIB operation with ion beam for milling a surface from the top and electron beam for imaging of surfaces at an angle, (b) a typical image at 15.6 nm resolution, and (c) final 3-D data set based on assembly of segmented image stack (shown is pore space in light gray).
2013GL056970Rfs02.tifTIFF image770KAn example of image process on the slice with charging effect and scan marks. (a) original raw image, (b) an image after a sequence of image processing including background subtraction, the FFT bandwidth filter, enhanced contrasting, median filter, (c) a segmented result after thresholding of Figure S2b, (d) a segmented result with the step b–c without the FFT bandwidth filter (a rectangular area showing horizontal scan marks was processed separately so that a majority of scan marks were filtered), (e) a combined segmented results of steps c–d, and (f) the final segmented result with dilating once and eroding twice.
2013GL056970Rfs03.tifTIFF image564KAn example of image process on the slice with high image quality. (a) original raw image, (b) an image after a sequence of image processing including background subtraction, enhanced contrasting, median filter, and (c) the final segmented result after thresholding and dilating and erosion of Figure S3b.
2013GL056970Rsup0001readme.txtplain text document2KSupporting Information

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