Numerically robust minimal-scan reconstruction algorithms for diffraction tomography via radon transform inversion

  1. Mark A. Anastasio1,*,
  2. Xiaochuan Pan2

Article first published online: 22 APR 2002

DOI: 10.1002/ima.10014

Issue

International Journal of Imaging Systems and Technology

International Journal of Imaging Systems and Technology

Volume 12, Issue 2, pages 84–91, 2002

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How to Cite

Anastasio, M. A. and Pan, X. (2002), Numerically robust minimal-scan reconstruction algorithms for diffraction tomography via radon transform inversion. International Journal of Imaging Systems and Technology, 12: 84–91. doi: 10.1002/ima.10014

Author Information

  1. 1

    Pritzker Institute of Medical Engineering, Illinois Institute of Technology, 10 West 32nd Street, Chicago, Illinois 60616-3793

  2. 2

    Department of Radiology, The University of Chicago, Chicago, Illinois 60637

*Pritzker Institute of Medical Engineering, Illinois Institute of Technology, 10 West 32nd Street, Chicago, Illinois 60616-3793

Publication History

  1. Issue published online: 22 APR 2002
  2. Article first published online: 22 APR 2002

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Keywords:

  • topographic reconstruction;
  • diffraction tomography;
  • wavefield inversion

Abstract

It is widely believed that measurements from a full angular range of 2π are generally required to exactly reconstruct a complex-valued refractive index distribution in diffraction tomography (DT). In this work, we developed a new class of minimal-scan reconstruction algorithms for DT that utilizes measurements only over the angular range 0 ≤ ϕ ≤ 3π/2 to perform an exact reconstruction. These algorithms, referred to as minimal-scan estimate-combination (MS-E-C) reconstruction algorithms, effectively operate by transforming the DT reconstruction problem into a conventional x-ray CT reconstruction problem that requires inversion of the Radon transform. We performed computer simulations to compare the noise and numerical properties of the MS-E-C algorithms against existing filtered backpropagation-based algorithms. © 2002 Wiley Periodicals, Inc. Int J Imaging Syst Technol 12, 84–91, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/ima.10014

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