Comparison of retinal nerve fiber layer thickness measurements by spectral-domain optical coherence tomography systems using a phantom eye model

Authors

  • Roy de Kinkelder,

    Corresponding author
    1. Department of Biomedical Engineering & Physics, Academic Medical Center, University of Amsterdam, P.O. Box 22700, NL-1100 DE Amsterdam, The Netherlands
    2. Topcon Europe Medical b.v. Essebaan 11, NL-2908 LJ Capelle aan den IJssel the Netherlands
    • Phone: +31 20 56 68977, Fax: +31 20 69 17233
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  • Daniel M. de Bruin,

    1. Department of Biomedical Engineering & Physics, Academic Medical Center, University of Amsterdam, P.O. Box 22700, NL-1100 DE Amsterdam, The Netherlands
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  • Frank D. Verbraak,

    1. Department of Biomedical Engineering & Physics, Academic Medical Center, University of Amsterdam, P.O. Box 22700, NL-1100 DE Amsterdam, The Netherlands
    2. Department of Ophthalmology, Academic Medical Center, University of Amsterdam, P.O. Box 22700, NL-1100 DE Amsterdam, The Netherlands
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  • Ton G. van Leeuwen,

    1. Department of Biomedical Engineering & Physics, Academic Medical Center, University of Amsterdam, P.O. Box 22700, NL-1100 DE Amsterdam, The Netherlands
    2. MIRA Institute for Biomedical Technology and Technical Medicine & Faculty of Science and Technology, Biomedical Photonic Imaging Group, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands
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  • Dirk J. Faber

    1. Department of Biomedical Engineering & Physics, Academic Medical Center, University of Amsterdam, P.O. Box 22700, NL-1100 DE Amsterdam, The Netherlands
    2. Department of Ophthalmology, Academic Medical Center, University of Amsterdam, P.O. Box 22700, NL-1100 DE Amsterdam, The Netherlands
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Abstract

To quantify differences in nerve fiber layer thickness measurements by various spectral-domain optical coherence tomography (SD-OCT) systems, we developed a phantom eye model. We tested twelve SD-OCT systems of four manufacturers. All systems combined overestimated the 49 µm thick phantom RNFL thickness on average by 18 µm. Within brands, thickness measurements differed statistically significant for one Topcon, one RTVue and one Cirrus. Between brands, thickness determined with RTVue and Topcon differed statistically significant from Cirrus and Spectralis. The maximum difference between mean thicknesses is 3.6 µm within brands and 7.7 µm between brands. (© 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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