Review Article

Light emission induced by tunneling electrons from surface nanostructures observed by novel conductive and transparent probes

  1. Daisuke Fujita*,
  2. Keiko Onishi,
  3. Noriko Niori

Article first published online: 17 NOV 2004

DOI: 10.1002/jemt.20099

Issue

Microscopy Research and Technique

Microscopy Research and Technique

Special Issue: Nanomaterials Characterization Using Microscopy—Part I

Volume 64, Issue 5-6, pages 403–414, August 2004

Additional Information

How to Cite

Fujita, D., Onishi, K. and Niori, N. (2004), Light emission induced by tunneling electrons from surface nanostructures observed by novel conductive and transparent probes. Microsc. Res. Tech., 64: 403–414. doi: 10.1002/jemt.20099

Author Information

  1. Nanomaterials Laboratory, National Institute for Materials Science, 1-2-1 Sengen, Tsubuka, Ibaraki 305-0047, Japan

*National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan

Publication History

  1. Issue published online: 17 NOV 2004
  2. Article first published online: 17 NOV 2004
  3. Manuscript Accepted: 18 APR 2004
  4. Manuscript Received: 5 JAN 2004

Funded by

  • Active Nano-Characterization and Technology Project
  • Ministry of Education, Culture, Sports, Science and Technology of the Japanese Government

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Keywords:

  • scanning tunneling microscopy;
  • luminescence;
  • recombination;
  • GaAs, Ag(111);
  • tip-induced plasmon;
  • inelastic tunneling

Abstract

We have developed an ultrahigh-vacuum low-temperature scanning tunneling microscope (STM) equipped with a near-field optical detection system using novel conductive and optically transparent probes. Tunneling-electron induced photons generated in a nanometer-scale area just under the STM probe can be collected directly into the core of the optical fiber probe within the optical near-field region. Firstly, optical fiber probes coated with indium-tin-oxide thin film are applied to quantitative analysis of p-type GaAs(110) surface, where a decrease of light emission in photon mapping clearly extracts the existence of Zn accepter atoms located at the sub-surface layers. Secondly, in order to enhance the efficiency for inelastic tunneling excitation of a tip-induced plasmon mode, a STM probe coated with an Ag/ITO dual-layer film has been developed and applied to an Ag(111) surface, where photon mapping with a step resolution has been achieved by near-filed detection. Microsc. Res. Tech. 64:403–414, 2004. © 2004 Wiley-Liss, Inc.

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