Review Article

Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy

  1. Renaud Bachelot*,
  2. Gilles Lerondel,
  3. Sylvain Blaize,
  4. Sebastien Aubert,
  5. Aurelien Bruyant,
  6. Pascal Royer

Article first published online: 17 NOV 2004

DOI: 10.1002/jemt.20102

Issue

Microscopy Research and Technique

Microscopy Research and Technique

Special Issue: Nanomaterials Characterization Using Microscopy—Part I

Volume 64, Issue 5-6, pages 441–452, August 2004

Additional Information

How to Cite

Bachelot, R., Lerondel, G., Blaize, S., Aubert, S., Bruyant, A. and Royer, P. (2004), Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy. Microsc. Res. Tech., 64: 441–452. doi: 10.1002/jemt.20102

Author Information

  1. Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), CNRS FRE 2671, Université de Technologie de Troyes (UTT)-12, BP2060.10010 Troyes, France

*Laboratoire de Nanotechnologie et d'Instrumentation Optique (LNIO), CNRS FRE 2671, Université de Technologie de Troyes (UTT)-12, rue Marie Curie, BP2060.10010 Troyes Cedex, France

Publication History

  1. Issue published online: 17 NOV 2004
  2. Article first published online: 17 NOV 2004
  3. Manuscript Accepted: 3 JUL 2004
  4. Manuscript Received: 22 FEB 2004

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Keywords:

  • integrated optics;
  • SNOM;
  • NSOM;
  • near-field optics;
  • apertureless;
  • photonic structure;
  • optoelectronics;
  • scanning near-field optical microscopy and spectroscopy;
  • waveguide;
  • semiconductor lasers

Abstract

This report presents the Apertureless Scanning Optical Near-Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub-wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few years. By significant examples, it is shown that this specific probe microscopy allows for in situ local quantitative study of semiconductor lasers in operation, integrated optical waveguides produced by ion exchange (single channel or Y junction), and photonic structures. Microsc. Res. Tech. 64:441–452, 2004. © 2004 Wiley-Liss, Inc.

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