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Review Article
Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy
Article first published online: 17 NOV 2004
DOI: 10.1002/jemt.20102
Copyright © 2004 Wiley-Liss, Inc.
Issue
Microscopy Research and Technique
Special Issue: Nanomaterials Characterization Using Microscopy—Part I
Volume 64, Issue 5-6, pages 441–452, August 2004
Additional Information
How to Cite
Bachelot, R., Lerondel, G., Blaize, S., Aubert, S., Bruyant, A. and Royer, P. (2004), Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy. Microsc. Res. Tech., 64: 441–452. doi: 10.1002/jemt.20102
Publication History
- Issue published online: 17 NOV 2004
- Article first published online: 17 NOV 2004
- Manuscript Accepted: 3 JUL 2004
- Manuscript Received: 22 FEB 2004
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